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Spectrometry, Mass, Secondary Ion MeSH Descriptor Data 2025


MeSH Heading
Spectrometry, Mass, Secondary Ion
Tree Number(s)
E05.196.566.760
Unique ID
D018629
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D018629
Annotation
for SIMS microscopy, coordinate with type of microscopy
Scope Note
A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.
Entry Version
SPECTROMETRY MASS SECOND ION
Entry Term(s)
Mass Spectrometry, Secondary Ion
Mass Spectroscopy, Secondary Ion
SIMS Microscopy
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry Microscopy
Secondary Ion Mass Spectroscopy
Secondary Ion Mass Spectroscopy Microscopy
Spectroscopy, Mass, Secondary Ion
Previous Indexing
Spectrum Analysis, Mass (1976-1994)
Public MeSH Note
95
History Note
95
Date Established
1995/01/01
Date of Entry
1994/05/12
Revision Date
2006/07/05
Spectrometry, Mass, Secondary Ion Preferred
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