- Concept UI
- M0020233
- Scope Note
- The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods.
- Terms
-
Spectrometry, X-Ray Emission
Preferred Term
Term UI
T038463
Date01/01/1999
LexicalTag
NON
ThesaurusID
NLM (1978)
-
Spectrometry, X-Ray Fluorescence
Term UI
T038465
Date03/29/1977
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
Spectrometry, Xray Emission
Term UI
T038464
Date01/09/1978
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
X-Ray Emission Spectrometry
Term UI
T038462
Date03/29/1977
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
X-Ray Fluorescence Spectrometry
Term UI
T038466
Date03/29/1977
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
Particle Induced X Ray Emission Spectrometry
Term UI
T038453
Date04/11/1988
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
Particle-Induced X-Ray Emission Spectrometry
Term UI
T038455
Date04/11/1988
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
Spectrometry, Particle-Induced X-Ray Emission
Term UI
T038456
Date04/11/1988
LexicalTag
NON
ThesaurusID
UNK (19XX)
-
Spectrometry, Particle Induced X Ray Emission
Term UI
T038454
Date04/11/1988
LexicalTag
NON
ThesaurusID
UNK (19XX)