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Electron Probe Microanalysis MeSH Descriptor Data 2023


MeSH Heading
Electron Probe Microanalysis
Tree Number(s)
E01.370.350.515.402.250
E05.196.867.800.360
E05.595.402.250
E05.799.830.360
Unique ID
D004577
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D004577
Scope Note
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
Entry Version
ELECTRON PROBE MICROANAL
Entry Term(s)
Microanalysis, Electron Probe
Microscopy, Electron, X-Ray Microanalysis
Spectrometry, X Ray Emission, Electron Microscopic
Spectrometry, X Ray Emission, Electron Probe
Spectrometry, X-Ray Emission, Electron Microscopic
Spectrometry, X-Ray Emission, Electron Probe
X Ray Emission Spectrometry, Electron Microscopic
X Ray Emission Spectrometry, Electron Probe
X-Ray Emission Spectrometry, Electron Microscopic
X-Ray Emission Spectrometry, Electron Probe
X-Ray Microanalysis
X-Ray Microanalysis, Electron Microscopic
X-Ray Microanalysis, Electron Probe
Previous Indexing
Electrons (1966)
Spectrum Analysis (1966)
See Also
Nuclear Microscopy
Public MeSH Note
70
History Note
70(67)
Date Established
1970/01/01
Date of Entry
1999/01/01
Revision Date
2012/07/03
Electron Probe Microanalysis Preferred
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