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Nuclear Microscopy MeSH Descriptor Data 2022


MeSH Heading
Nuclear Microscopy
Tree Number(s)
E01.370.350.515.744
E05.595.744
Unique ID
D062345
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D062345
Scope Note
A method of simultaneously imaging and measuring elements at the submicron level. Nuclear microscopy uses a focused high-energy ion beam of PROTONS and ALPHA PARTICLES (a nuclear microprobe) to interact with the sample. The resulting emitted radiations are analyzed by a group of techniques simultaneously: PARTICLE INDUCED X RAY EMISSION SPECTROMETRY for minor and trace element identification; Rutherford Backscattering Spectroscopy to assess sample thickness and bulk elements such as carbon, hydrogen, oxygen, and nitrogen; and Scanning Transmission Ion Microscopy to assess sample structure and density.
Entry Term(s)
Nuclear Microscope Analysis
Scanning Nuclear Microprobe Analysis
See Also
Electron Probe Microanalysis
Public MeSH Note
2013
History Note
2013
Date Established
2013/01/01
Date of Entry
2012/07/03
Nuclear Microscopy Preferred
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