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Microscopy, Scanning Probe MeSH Descriptor Data 2022


MeSH Heading
Microscopy, Scanning Probe
Tree Number(s)
E01.370.350.515.666
E05.595.666
Unique ID
D020527
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D020527
Scope Note
Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
Entry Term(s)
Scanning Probe Microscopy
Previous Indexing
Microscopy, Atomic Force (1999)
Public MeSH Note
2000; see MICROSCOPY, ATOMIC FORCE 1999
History Note
2000; use MICROSCOPY, ATOMIC FORCE 1999
Date Established
2000/01/01
Date of Entry
1999/11/03
Revision Date
2004/07/07
Microscopy, Scanning Probe Preferred
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