MeSH Browser

MeSH Heading: Microscopy, Atomic Force
Tree Number(s): E01.370.350.515.666.400; E05.595.666.400
Unique ID: D018625
RDF Unique Identifier: http://id.nlm.nih.gov/mesh/D018625
Scope Note: A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Entry Term(s): Atomic Force Microscopy; Force Microscopy; Scanning Force Microscopy
Previous Indexing: Microscopy (1988-1994); Microscopy, Scanning Tunneling (1988-1994)
See Also: Microscopy, Scanning Tunneling
Public MeSH Note: 95
History Note: 95
Date Established: 1995/01/01
Date of Entry: 1994/04/16
Revision Date: 2004/07/07

Allowable Qualifiers: classification (CL)

economics (EC)

ethics (ES)

history (HI)

instrumentation (IS)

methods (MT)

standards (ST)

statistics & numerical data (SN)

trends (TD)

veterinary (VE)

Concept UI: M0027912
Scope Note: A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Terms: Microscopy, Atomic Force Preferred Term
Term UI T055458
Date01/01/1999
LexicalTag NON
ThesaurusID NLM (1995); Atomic Force Microscopy
Term UI T055457
Date12/23/1993
LexicalTag NON
ThesaurusID NLM (1995); Scanning Force Microscopy
Term UI T055459
Date05/21/1998
LexicalTag NON
ThesaurusID NLM (1999); Force Microscopy
Term UI T055460
Date05/21/1998
LexicalTag NON
ThesaurusID NLM (1999)

Microscopy, Atomic Force MeSH Descriptor Data 2024