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Microscopy, Atomic Force MeSH Descriptor Data 2023


MeSH Heading
Microscopy, Atomic Force
Tree Number(s)
E01.370.350.515.666.400
E05.595.666.400
Unique ID
D018625
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D018625
Scope Note
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Entry Term(s)
Atomic Force Microscopy
Force Microscopy
Scanning Force Microscopy
Previous Indexing
Microscopy (1988-1994)
Microscopy, Scanning Tunneling (1988-1994)
See Also
Microscopy, Scanning Tunneling
Public MeSH Note
95
History Note
95
Date Established
1995/01/01
Date of Entry
1994/04/16
Revision Date
2004/07/07
Microscopy, Atomic Force Preferred
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