MeSH Browser

MeSH Heading: Volume Electron Microscopy
Tree Number(s): E01.370.350.515.402.812; E05.595.402.812; L01.224.308.705
Unique ID: D000094443
RDF Unique Identifier: http://id.nlm.nih.gov/mesh/D000094443
Scope Note: Electron microscopy techniques designed to reconstruct 3-D images at micrometer volume scales at nanometer (nm) level resolutions. Volume electron microscopy uses various techniques to render, segment and reconstruct 3-D images from stacked sequential 2-D images of incremental z-planes.
Entry Term(s): FIB-SEM; Focused Ion Beam SEM; Focused Ion Beam Scanning Electron Microscopy; SBF-SEM; Serial Block-Face SEM; Serial Block-Face Scanning Electron Microscopy; Serial Sectioning TEM; Serial Sectioning Transmission Electron Microscopy; Volume EM; ssTEM; vEM Volume Electron Microscopy
Previous Indexing: Microscopy, Electron (1983-2022)
Public MeSH Note: 2023
History Note: 2023
Date Established: 2023/01/01
Date of Entry: 2022/07/12
Revision Date: 2022/07/12

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Volume Electron Microscopy MeSH Descriptor Data 2024