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Microscopy, Electron, Scanning MeSH Descriptor Data 2022


MeSH Heading
Microscopy, Electron, Scanning
Tree Number(s)
E01.370.350.515.402.541
E05.595.402.541
Unique ID
D008855
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D008855
Annotation
do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM
Scope Note
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
Entry Term(s)
Electron Scanning Microscopy
Scanning Electron Microscopy
Previous Indexing
Microscopy, Electron (1966-1968)
See Also
Corrosion Casting
Public MeSH Note
72
History Note
72(69)
Date Established
1972/01/01
Date of Entry
1999/01/01
Revision Date
2016/02/08
Microscopy, Electron, Scanning Preferred
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